Device and method for on-die temperature measurement
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United States of America Patent
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Feb 1, 2011
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app pub date -
Dec 30, 2004
filing date -
Dec 30, 2004
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Abstract
A system for measuring and managing thermal operations of a processor core on a semiconductor die using a sensor positioned in a hotspot of the processor core. A measured temperature reading is determined based upon a temperature sensed by the sensor. Interrupt signals and a software readable register indicating temperature information provide feedback about the thermal environment to the processor. Based upon the measured temperature reading, the interrupt signals direct the processor to modify operation.
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