Method for correcting biparametric spectra

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United States of America Patent

PATENT NO 7881893
APP PUB NO 20080061224A1
SERIAL NO

11587645

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Abstract

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A method for processing a two-parameter spectrum including selecting a profile parameter for the spectrum and an initial correction function, for any profile selected according to this parameter, carrying out at least a correction operation by multiplying this selected profile by a correction function, equal to the sum of at least a portion of the already corrected profiles.

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Patent Owner(s)

Patent OwnerAddress
COMMISSARIAT A L'ENERGIE ATOMIQUE25 RUE LEBLANC BATIMENT "LE PONANT D" F-75015 PARIS
COMPAGNIE GENERALE DES MATIERES NUCLEAIRES78140 VELIZY-VILLACOUBLAY 2 RUE PAUL DAUTIER

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Montemont, Guillaume Grenoble, FR 20 71

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