Successive approximate capacitance measurement circuit

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United States of America Patent

PATENT NO 7884621
APP PUB NO 20080068030A1
SERIAL NO

11983291

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Abstract

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A capacitance measurement circuit includes a current source, a switch, and a comparator. The current source is coupled to drive a current through a circuit node. The switch is coupled to the circuit node to switch the current into a device under test (“DUT”) capacitor. The comparator includes first and second input ports. The comparator is coupled to compare a first voltage received on the first input port against a reference voltage received on the second input port. The first voltage is related to the current driven through the circuit node, a frequency at which the switch is switched, and a capacitance of the DUT capacitor.

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Patent Owner(s)

Patent OwnerAddress
MONTEREY RESEARCH LLC3945 FREEDOM CIRCLE SUITE 900 SANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Snyder, Warren S Snohomish, US 35 612

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