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Abstract

In one aspect, a non-volatile semiconductor memory device includes a phase phase-change memory cell array including a plurality of word lines, a plurality of bit lines, and a plurality of phase-change memory cells, where each the phase-change memory cells includes a phase-change resistive element and a diode connected in series between a word line and a bit line among the plurality of word lines and bit lines of the phase-change memory cell array. The memory device of this aspect further includes a sense node which is selectively connected to a bit line of the phase-change memory cell array, a boosting circuit which generates a boosted voltage which is greater than an internal power supply voltage, a pre-charge and biasing circuit which is driven by the boosted voltage to pre-charge and bias the sense node, and a sense amplifier connected to the sense node. The boosted voltage may be equal to or greater than a sum of the internal power supply voltage and a threshold voltage of the diode of each phase-change memory cell.

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First Claim