Method and apparatus for testing devices using serially controlled resources
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United States of America Patent
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Feb 15, 2011
Grant Date -
Mar 26, 2009
app pub date -
Sep 25, 2007
filing date -
Sep 25, 2007
priority date (Note) -
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Abstract
Methods and apparatus for testing devices using serially controlled resources have been described. Examples of the invention can relate to an apparatus for testing a device under test (DUT). In some examples, an apparatus can include an integrated circuit (IC) having a serialized input coupled to test circuits, the test circuits selectively communicating test signals with the DUT responsive to a test control signal on the serialized input.
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