Method and apparatus for storing failing part locations in a module
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Feb 15, 2011
Grant Date -
Dec 13, 2007
app pub date -
Mar 19, 2007
filing date -
Apr 13, 2000
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A non-volatile storage device on a memory module comprising a plurality of memory devices is used to store the locations of defective parts on the memory module, such as data query (“DQ”) terminals, identified during a testing procedure. After testing, the non-volatile storage device, such as an electrically erasable programmable read only memory (“EEPROM”), may be accessed to determine specific memory devices such as dynamic random access memory (“DRAM”) which need to be repaired or replaced rather than re-testing the specific memory module.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully