Electro-optical measurement of hysteresis in interferometric modulators

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Feb 22, 2011
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Jul 31, 2008
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Feb 14, 2008
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Sep 27, 2004

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Abstract

Disclosed herein are methods and apparatus for testing interferometric modulators. The interferometric modulators may be tested by applying a time-varying voltage stimulus and measuring the resulting reflectivity from the modulators.

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SNAPTRACK, INC.

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G01B:MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIME....

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Inventor Name	Address	# of filed Patents	Total Citations
Cummings, William J	Millbrae, US	130	4870
Gally, Brian	Los Gatos, US	32	982

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Electro-optical measurement of hysteresis in interferometric modulators

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United States of America Patent

12031602

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PATENT NO	7894076
APP PUB NO	20080180680A1
SERIAL NO	12031602
DOCKET NO

US Family Size	Non-US Coverage
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DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
February 22, 2011	US,7894076,B2 US7894076B2	GRANTED PATENT AS SECOND PUBLICATION
July 31, 2008	US,20080180680,A1 US20080180680A1	FIRST PUBLISHED PATENT APPLICATION

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