Probe for testing a device under test

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7898273
APP PUB NO 20090267625A1
SERIAL NO

12378659

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.

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Patent Owner(s)

  • CASCADE MICROTECH, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Andrews, Mike Cornelius, US 61 1543
Gleason, K Reed Portland, US 49 1829
Lesher, Tim Portland, US 18 262
Martin, John Portland, US 225 6142

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