Interface for testing semiconductors

United States of America Patent

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Mar 1, 2011
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app pub date
Dec 12, 2008
filing date
Jan 31, 2005

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Abstract

A system includes an imaging device for capturing a video sequence and a display for displaying the video in a window of the display and effectively positioning a probe relative to probe pads of a device under test for testing a semiconductor wafer supported by a support of a probing environment.

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Patent Owner	Address
FORMFACTOR INC	7005 SOUTHFRONT ROAD LIVERMORE CA 94551

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G01R:MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC V....

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Inventor Name	Address	# of filed Patents	Total Citations
Andrews, Peter	Beaverton, US	94	2691
Hess, David	Beaverton, US	36	260
New, Robert	Beaverton, US	4	21

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Interface for testing semiconductors

Number of patents in Portfolio can not be more than 2000

United States of America Patent

12316511

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US Family Size	Non-US Coverage
Patent Longevity	Forward Citations

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
March 01, 2011	US,7898281,B2 US7898281B2	GRANTED PATENT AS SECOND PUBLICATION
May 28, 2009	US,20090134896,A1 US20090134896A1	FIRST PUBLISHED PATENT APPLICATION

PATENT NO	7898281
SERIAL NO	12316511
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12316511

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