Holographic interferometry for non-destructive testing of power sources
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United States of America Patent
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Mar 22, 2011
Grant Date -
Nov 27, 2008
app pub date -
May 16, 2008
filing date -
May 17, 2007
priority date (Note) -
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Abstract
The present invention is connected with the holographic interferometry method and device that provides, to a very high precision, the reconstructing the original waveform of light emitted or reflected by an object. This method allows image resolution close to that of the wavelength of the light being used. The non-destructive method of holographic interferometry coupled with impulse heating of the test article to allow observation of its dynamic response to operating conditions, as described herein, is one of the most effective non-contact automated quality control methods available.
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