Non-uniform sampling to extend dynamic range of interferometric sensors
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United States of America Patent
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Mar 29, 2011
Grant Date -
May 14, 2009
app pub date -
Nov 13, 2007
filing date -
Nov 13, 2007
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Abstract
Methods and apparatus for interrogating optical sensors with high slew rates using non-uniform sampling are provided. The transmission of optical signals in a non-uniform pattern is employed to allow for demodulation of fringe rates exceeding the commonly understood Nyquist frequency limit given as one half of the mean sampling frequency. By monitoring the time dependent fringe frequency and assuming that the fringe frequency has a limited bandwidth, only a limited bandwidth smaller than the Nyquist bandwidth around the instantaneous fringe frequency needs to be reconstructed at any time.
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