Fast and high-precision 3D tracking and position measurement with MEMS micromirrors

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United States of America Patent

PATENT NO 7924441
SERIAL NO

12538093

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Abstract

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An optical locating and tracking system may have two or more optical scanners, one or more optical detectors responsive to radiation from one or more optical sources, and a controller coupled to the detector(s) and the scanner(s). Each scanner has a reflector mounted to a two-dimensional actuator that tilts the reflector about first and second axes. The controller determines whether a given reflector of a given scanner is aligned to provide an optical path between the optical source(s) and the detector(s) from one or more detection signals from the one or more optical detectors. The optical path originates, terminates or is deflected at the object. The controller also determines the object's position in three dimensions from control signals to the two-dimensional actuators of the scanners obtained the reflectors are aligned to provide the optical path. The control signals determine a tilt of each reflector about its first and second axes.

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Patent Owner(s)

Patent OwnerAddress
MIRRORCLE TECHNOLOGIES INC4905 CENTRAL AVE SUITE 200 RICHMOND CA 94804

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Milanović, Veljko El Cerrito, US 3 99

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