X-ray condensing method and its device using phase restoration method

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United States of America Patent

PATENT NO 7936860
APP PUB NO 20100183122A1
SERIAL NO

12440121

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An X-ray condensing method and its device are provided with an X-ray mirror that has a wavefront adjustable function to finely adjust a wavefront of a reflecting X-ray, measure an X-ray intensity distribution in the vicinity of a focus, measure an X-ray intensity distribution in the vicinity of the X-ray mirror or use a known X-ray intensity distribution of an incident X-ray, calculate a complex amplitude distribution at the reflective surface by using a phase restoration method from the X-ray intensity distribution in the vicinity of the focus and the X-ray intensity distribution in the vicinity of the reflective surface, calculate a wavefront aberration of an X-ray condensing optical system from the complex amplitude distribution, and control the reflective surface of the X-ray mirror with the wavefront adjustable function so that the wavefront aberration is minimized.

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Patent Owner(s)

Patent OwnerAddress
OSAKA UNIVERSITYSUITA-SHI OSAKA 565-0871
JTEC CORPORATION2-5-38 SAITOYAMABUKI IBARAKI-SHI OSAKA 5670086 ?5670086

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Mimura, Hidekazu Suita, JP 8 4
Okada, Hiromi Kobe, JP 21 99
Yamauchi, Kazuto Suita, JP 33 238

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