Tandem fourier transform ion cyclotron resonance mass spectrometer

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United States of America Patent

PATENT NO 7939799
APP PUB NO 20090008549A1
SERIAL NO

12278768

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Abstract

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according to the mass spectrometer. Accordingly, It can solve various problems (e.g., the radius reduction of cyclotron motion of colliding ions, or the removal of periphery gas after generating the fragment ions) occurred in a tandem mass spectrometer using a conventional tandem-in-time mass analysis method. Also, a high resolution and with sensitivity measurement can be achieved. Moreover, when a reagent gas instead of a collision gas in the collision cell is injected, the gas phase reaction of the selected ions and the reagent gas can be observed, and the mass of the ions generated in the gas phase reaction can be measured.

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Patent Owner(s)

  • KOREA BASIC SCIENCE INSTITUTE

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Choi, Myoung Choul Seoul, KR 15 33
Kim, Hyun Sik Daejeon, KR 113 380
Yoo, Jong Shin Daejeon, KR 27 52

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