Pattern search method

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United States of America Patent

PATENT NO 7941008
APP PUB NO 20050232493A1
SERIAL NO

11104632

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Abstract

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According to the pattern search method of the present invention, detection of a detection image region relative to an observation image is performed by a pattern matching. An image whose size is substantially the same as that of the observation image is used as the detection image region. The detection image region is relatively displaced with reference to the observation image, thereby detecting a degree of similarity for a common region which is common to both of the region and the image. Displacement range of the detection image region is set in advance. If area of the common region is larger than a predetermined value, calculating the degree of similarity will be performed.

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Patent Owner(s)

Patent OwnerAddress
HITACHI HIGH-TECH CORPORATION17-1 TORANOMON 1-CHOME MINATO-KU TOKYO 1056409 ?1056409

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Komuro, Osamu Hitachinaka, JP 44 446
Satou, Norio Ibaraki, JP 9 65
Sugiyama, Akiyuki Hitachinaka, JP 33 504
Yamaguchi, Satoru Hitachinaka, JP 96 1491

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