Low profile probe having improved mechanical scrub and reduced contact inductance
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United States of America Patent
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May 17, 2011
Grant Date -
May 6, 2010
app pub date -
Jan 8, 2010
filing date -
Dec 7, 2005
priority date (Note) -
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status (Latency Note)
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Abstract
A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, such that it includes three or more vertical arm portions. The vertical arm portions have substantial vertical overlap, and are laterally displaced from each other. When such a probe is vertically brought down onto a device under test, the probe deforms. During probe deformation, at least two of the vertical arm portions come into contact with each other. Such contact between the arm portions can advantageously increase the lateral scrub motion at the probe tip, and can also advantageously reduce the probe inductance.
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