Method and apparatus for generating expect data from a captured bit pattern, and memory device using same

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United States of America Patent

PATENT NO 7954031
APP PUB NO 20100106997A1
SERIAL NO

12649137

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Abstract

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Expect data signals are generated for a series of applied data signals having a known sequence to determine if groups of the data signals were properly captured. A first group of the applied data signals is captured, and a group of expect data signals are generated from the captured first group. A second group of applied data signals is then captured and determined to have been properly captured when the second group corresponds to the group of expect data signals. In this way, when a captured series of data signals is shifted in time from an expected capture point, subsequent captured data signals are compared to their correct expected data signals in order to determine whether that group, although shifted in time, was nonetheless correctly captured. A pattern generator generates expect data signals in this manner, and may be utilized in a variety of integrated circuits, such as an SLDRAM.

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Patent Owner(s)

  • ROUND ROCK RESEARCH, LLC

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Manning, Troy A Meridian, US 297 12379

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