
US Patent No: 7,954,031
Number of patents in Portfolio can not be more than 2000
Method and apparatus for generating expect data from a captured bit pattern, and memory device using same
Stats
-
May 31, 2011
Issued date -
Dec 29, 2009
filing date -
12/649,137
serial no -
In Force
status
Importance
Abstract
Expect data signals are generated for a series of applied data signals having a known sequence to determine if groups of the data signals were properly captured. A first group of the applied data signals is captured, and a group of expect data signals are generated from the captured first group. A second group of applied data signals is then captured and determined to have been properly captured when the second group corresponds to the group of expect data signals. In this way, when a captured series of data signals is shifted in time from an expected capture point, subsequent captured data signals are compared to their correct expected data signals in order to determine whether that group, although shifted in time, was nonetheless correctly captured. A pattern generator generates expect data signals in this manner, and may be utilized in a variety of integrated circuits, such as an SLDRAM.
First Claim
Related Publications
International Classification(s)
- [Classification Symbol]
- [Patents Count]
Cited Art
| Patent Info | (Count) | # Cites | Year |
|---|---|---|---|
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Patent Citation Ranking
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