Systems and methods to measure banding print defects
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United States of America Patent
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Jun 21, 2011
Grant Date -
Oct 11, 2007
app pub date -
Apr 6, 2006
filing date -
Apr 6, 2006
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A defect once around signal time period of a defect source inherent in a marking device is determined, the defect source having one or more banding frequencies. A reference scanline time delay, which is a time between a page sync signal and a writing of a reference scanline, is determined. A test target is written, sensed and analyzed. A reference scanline phase offset of each banding frequency relative to the reference scanline is determined. A banding phase of each banding frequency is determined based at least on the defect once around signal time period, reference scanline time delay and reference scanline phase offset.
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