Haptic profiling system and method
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United States of America Patent
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Jul 19, 2011
Grant Date -
Aug 25, 2005
app pub date -
Dec 17, 2004
filing date -
Dec 19, 2003
priority date (Note) -
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status (Latency Note)
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Abstract
An apparatus includes a characterization module configured to receive data associated with operational characteristics of a mechanical device, the operational characteristics being associated with a perceptual experience of the mechanical device. A conversion module is coupled to the characterization module. The conversion module is configured to automatically produce, substantially without user intervention, a parametric data set associated with the mechanical device based on the data. In another embodiment, a method includes receiving data associated with operational characteristics of a mechanical device. The operational characteristics are associated with a perceptual experience of the mechanical device. A parametric data set associated with the mechanical device is produced automatically, without user intervention. The parametric data set is associated with the mechanical device based on the data.
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