Signal processing for optical computing system
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United States of America Patent
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Aug 2, 2011
Grant Date -
Jun 17, 2010
app pub date -
Nov 1, 2007
filing date -
Nov 2, 2006
priority date (Note) -
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Abstract
The present subject matter relates to methods of high-speed analysis of product samples during production of the product. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward optical detectors. Signals from the optical detectors are compared to determine characteristics of the product under analysis. Temperature within the monitoring system may be monitored in order to provide compensation for the signals produced by the optical detectors. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.
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