Phase change memory device and manufacturing method

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United States of America Patent

PATENT NO 8008114
APP PUB NO 20100291747A1
SERIAL NO

12843806

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Abstract

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A phase change memory device comprises a photolithographically formed phase change memory cell having first and second electrodes and a phase change element positioned between and electrically coupling the opposed contact elements of the electrodes to one another. The phase change element has a width, a length and a thickness. The length, the thickness and the width are less than a minimum photolithographic feature size of the process used to form the phase change memory cell. The size of the photoresist masks used in forming the memory cell may be reduced so that the length and the width of the phase change element are each less than the minimum photolithographic feature size.

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Patent Owner(s)

  • MACRONIX INTERNATIONAL CO., LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Shih-Hung Hsinchu, US 172 4475
Lung, Hsiang-Lan Dobbs Ferry, US 308 9509

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