Double sided probing structures
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United States of America Patent
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Sep 6, 2011
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app pub date -
Jul 3, 2008
filing date -
Sep 13, 2004
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Abstract
A test configuration for double sided probing of a device under test includes a holder to secure the device under test in a first orientation, a calibration substrate secured in a second orientation and a probe capable of calibration using the calibration substrate and probing the device under test.
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