System and method for calibrating optical characteristics
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United States of America Patent
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Sep 27, 2011
Grant Date -
Jun 2, 2011
app pub date -
Feb 9, 2011
filing date -
Feb 21, 2002
priority date (Note) -
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Abstract
A miniaturized spectrometer/spectrophotometer system and methods are disclosed. A probe tip including one or more light sources and a plurality of light receivers is provided. A first spectrometer system receives light from a first set of the plurality of light receivers. A second spectrometer system receives light from a second set of the plurality of light receivers. A processor, wherein the processor receives data generated by the first spectrometer system and the second spectrometer system, wherein an optical measurement of a sample under test is produced based on the data generated by the first and second spectrometer systems.
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