AFM tweezers, method for producing AFM tweezers, and scanning probe microscope
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United States of America Patent
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Oct 4, 2011
Grant Date -
Jan 1, 2009
app pub date -
Jun 20, 2008
filing date -
Jun 22, 2007
priority date (Note) -
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Abstract
AFM tweezers that include a first probe, including a triangular prism member having a tip of a ridge which is usable as a probe tip in a scanning probe microscope, and a second probe, including a triangular prism member provided so as to open/close with respect to the first probe, are provided. The first probe and the second probe are juxtaposed such that a predetermined peripheral surface of the triangular prism member of the first probe and a predetermined peripheral surface of the triangular prism member of the second probe face substantially in parallel to each other, and the first probe formed of a notch that prevents interference with a sample when the sample is scanned by the tip of the ridge.
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