Non-destructive testing method and apparatus
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United States of America Patent
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Oct 4, 2011
Grant Date -
Sep 13, 2007
app pub date -
Jan 24, 2007
filing date -
Jun 15, 2004
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Non-destructive testing apparatus may comprise a photon source and a source material that emits positrons in response to bombardment of the source material with photons. The source material is positionable adjacent the photon source and a specimen so that when the source material is positioned adjacent the photon source it is exposed to photons produced thereby. When the source material is positioned adjacent the specimen, the specimen is exposed to at least some of the positrons emitted by the source material. A detector system positioned adjacent the specimen detects annihilation gamma rays emitted by the specimen. Another embodiment comprises a neutron source and a source material that emits positrons in response to neutron bombardment.
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