Metalized elastomeric probe structure
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United States of America Patent
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Nov 8, 2011
Grant Date -
Apr 24, 2008
app pub date -
Sep 30, 2005
filing date -
Dec 16, 2004
priority date (Note) -
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Abstract
A probe structure for an electronic device is provided. In one aspect, the probe structure includes an electrically insulating carrier having one or more contact structures traversing a plane thereof. Each contact structure includes an elastomeric material having an electrically conductive layer running along at least one surface thereof continuously through the plane of the carrier. The probe structure includes one or more other contact structures adapted for connection to a test apparatus.
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