Method for operating a secure semiconductor IP server to support failure analysis
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United States of America Patent
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Nov 15, 2011
Grant Date -
Feb 4, 2010
app pub date -
Sep 5, 2007
filing date -
Oct 13, 2006
priority date (Note) -
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Abstract
A method for operating a secure semiconductor IP access server to support failure analysis. A client presents a test failure and failure type to an automated server which traverses an electronic product design, definition, and test database to report specifically those components and interconnect likely to cause the failure with geometrical information which may be displayed on the client. Other aspects of semiconductor IP are protected by the server by limiting the trace mechanism and renaming components.
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