Method of expanding tester drive and measurement capability
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United States of America Patent
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-
Nov 29, 2011
Grant Date -
Oct 29, 2009
app pub date -
Jul 7, 2009
filing date -
Jun 6, 2006
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A probe card assembly can comprise an interface, which can be configured to receive from a tester test signals for testing an electronic device. The probe card assembly can further comprise probes for contacting the electronic device and electronic driver circuits for driving the test signals to ones of the probes.
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