US Patent No: 8,080,873

Number of patents in Portfolio can not be more than 2000

Semiconductor device, semiconductor package, and method for testing semiconductor device

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ALSO PUBLISHED AS: 20050200005
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Importance

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Abstract

A semiconductor device designed to facilitate testing. Superimposed first and second semiconductor chips each include a plurality of internal terminals, an external terminal, and a plurality of transistors. A plurality of wires connect the internal terminals, the transistors, and the external terminals of the first and second semiconductor chips in series.

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First Claim

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Patent Owner(s)

Patent OwnerAddressTotal Patents
FUJITSU SEMICONDUCTOR LIMITEDTOKYO4441

International Classification(s)

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  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ito, Yoshito Kasugai, JP 9 186
Sekiyama, Akinori Kasugai, JP 4 16
Tanaka, Hiroyuki Kadoma, JP 707 2120

Cited Art

Patent Info (Count) # Cites Year
 
RENESAS ELECTRONICS CORPORATION (3)
6,831,502 Internal power-source potential supply circuit, step-up potential generating system, output potential supply circuit, and semiconductor memory 3 1996
6,441,669 Internal power-source potential supply circuit, step-up potential generating system, output potential supply circuit, and semiconductor memory 5 2001
6,473,321 Semiconductor integrated circuit and nonvolatile semiconductor memory 29 2001
 
FREESCALE SEMICONDUCTOR, INC. (1)
6,476,506 Packaged semiconductor with multiple rows of bond pads and method therefor 55 2001
 
SUN MICROSYSTEMS, INC. (1)
5,528,083 Thin film chip capacitor for electrical noise reduction in integrated circuits 74 1994

Patent Citation Ranking

Forward Cites

Patent Info (Count) # Cites Year
 
SK HYNIX INC. (1)
8,375,558 Semiconductor apparatus and repairing method thereof 0 2010

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