RF chip test method
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United States of America Patent
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Dec 27, 2011
Grant Date -
May 20, 2010
app pub date -
Jan 20, 2009
filing date -
Nov 19, 2008
priority date (Note) -
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status (Latency Note)
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Abstract
An RF chip test method is disclosed. The RF chip test method includes disposing an RF chip within a chip socket, with the RF chip having at least one RF pin and at least one non-RF pin, the chip socket having conductive elements, and the conductive elements contacting the RF pin and the non-RF pin; connecting the non-RF pin to a ground end and connecting the RF pin to an RF measuring instrument; measuring a S11 parameter of the RF pin using the RF measuring instrument; and comparing the S11 parameter with an allowable range so as to judge the contact condition between the RF pin and the conductive element.
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