Systems and methods for a multiple angle light scattering (MALS) instrument having two-dimensional detector array

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United States of America Patent

PATENT NO 8085399
APP PUB NO 20100027007A1
SERIAL NO

12534780

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Abstract

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A particle detection system uses a reflective optic comprising a curved surface to detect high angle scattered light generated by a particle in a liquid medium, when a laser beam is incident on the particle. When the particles transit the laser beam, light is scattered in all directions and is described by MIE scattering theory for particles about the size of the wavelength of light and larger or Rayleigh Scattering when the particles are smaller than the wavelength of light. By using the reflective optic, the scattered light can be detected over angles that are greater than normally obtainable.

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Patent Owner(s)

Patent OwnerAddress
JMAR LLC10905 TECHNOLOGY PLACE SAN DIEGO CA 92127

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Adams, John A Escondido, US 53 2753
Bloom, Scott H Encinitas, US 20 599
Chan, Victor J San Diego, US 14 180
Crousore, Kristina M Oceanside, US 7 119
Gottlieb, Joseph S Escondido, US 4 30
Hemberg, Oscar La Jolla, US 23 521
Lyon, John J San Marcos, US 7 154
Spivey, Brett A Carlsbad, US 15 322

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