System and method for detecting flaws in objects using machine vision
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United States of America Patent
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Jan 24, 2012
Grant Date -
N/A
app pub date -
Sep 25, 2007
filing date -
Sep 25, 2007
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Abstract
This invention overcomes the disadvantages of the prior art by providing a system and method for flexibly detecting flaws in the acquired runtime/live images of objects based upon an inspection process that employs a training or model image of the object. This system and method enables predetermined flaws, and other predetermined features, within predetermined tolerances, to be disregarded as a flaw at inspection time. Typically, flexible flaw detection and repositioning of the model image occurs locally with respect to predetermined flaws and imperfections, and is undertaken after the image is acquired and the model image has undergone a global affine transformation/positioning with respect to the runtime image. Subsequent inspection then occurs with a locally repositioned model image that subsumes any imperfection or variation that is to be disregarded.
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