Elliptical photo-acoustic sensor

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United States of America Patent

PATENT NO 8117897
APP PUB NO 20080121018A1
SERIAL NO

11944892

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Abstract

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An elliptical photo-acoustic spectrometer chamber design will result in a larger intensity signal at the pick-up microphone and allow high frequency light modulation. This makes the spectrometer have a lower limit of detection threshold, and will increase the signal to noise ratio in general for the instrument, resulting in a more sensitive instrument allowing more precise measurements.

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Patent Owner(s)

  • APPLIED NANOTECH HOLDINGS, INC.;NANO-PROPRIETARY, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fink, Richard Lee Austin, US 65 818
Pavlovsky, Igor Cedar Park, US 36 521
Schropp,, Jr Donald R Austin, US 12 53

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