Methods, photomasks and methods of fabricating photomasks for improving damascene wire uniformity without reducing performance

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United States of America Patent

PATENT NO 8129095
APP PUB NO 20100261095A1
SERIAL NO

12622461

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Abstract

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A method of improving damascene wire uniformity without reducing performance. The method includes simultaneously forming a multiplicity of damascene wires and a multiplicity of metal dummy shapes in a dielectric layer of a wiring level of an integrated circuit chip, the metal dummy shapes being dispersed between damascene wires of the multiplicity of damascene wires; and removing or modifying those metal dummy shapes of the multiplicity of metal dummy shapes within exclusion regions around selected damascene wires of the multiplicity of damascene wires. Also a method of fabricating a photomask and a photomask for use in improving damascene wire uniformity without reducing performance.

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Patent Owner(s)

Patent OwnerAddress
GLOBALFOUNDRIES U S INC400 STONEBREAK ROAD EXTENSION MALTA NY 12020

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Grant, Casey Jon Hinesburg, US 2 11
Hankey, Jude L Essex Junction, US 2 13

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