Method of calibrating reflection characteristic measuring apparatus for sheet specimen
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United States of America Patent
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Mar 6, 2012
Grant Date -
Sep 15, 2011
app pub date -
May 19, 2011
filing date -
Nov 6, 2007
priority date (Note) -
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Abstract
A reflection characteristic measuring apparatus capable of scanning a specimen surface of a sheet specimen at a high speed is provided. The reflection characteristic measuring apparatus includes a group of illuminating and light-receiving systems for directing illuminating light onto the specimen surface of the sheet specimen held by a specimen holding roller pair and for receiving reflected light from the specimen surface. The illuminating and light-receiving systems measure a spectral characteristic of the received reflected light. The illuminating and light-receiving systems are disposed over one-dimensional arrays of color samples which extend in the longitudinal direction of the sheet specimen, and scan the one-dimensional arrays in a direction opposite to a direction in which the sheet specimen is transported.
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