Systems and methods for intelligent probe testing
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United States of America Patent
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Mar 6, 2012
Grant Date -
May 5, 2005
app pub date -
Aug 2, 2004
filing date -
Aug 1, 2003
priority date (Note) -
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Abstract
Systems and methods are disclosed for testing a processor having at least a first interface. In one embodiment, the method includes configuring, at the processor, a second interface, such that the configured second interface has one or more quality of service parameters representative of the first interface; sending one or more packets through the configured second interface, the one or more packets being representative of another packet received at the first interface; and determining, based on the one or more packets, one or more performance parameters corresponding to the first interface under test.
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