Method and device for measuring the spectral phase or the combined spectral and spatial phases of ultra short light pulses

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United States of America Patent

PATENT NO 8149414
APP PUB NO 20090168070A1
SERIAL NO

12345229

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The method and device for measuring the spectral phase or combined spectral and spatial phases of ultra short light pulses, consisting of a decomposition of the light pulse to be measured in two identical replicas called signal pulse and primary reference pulse, respectively, of different polarization or direction and the phase characteristics of which are essentially identical to the original pulse, a temporal filtering of the primary reference pulse by a nonlinear interaction generating a secondary reference pulse of average frequency essentially identical and of spectral width greater than the spectral width of the primary reference pulse, and a spectral interferometry measurement by recombination of this secondary reference pulse and the signal pulse with a given temporal offset.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Forget, Nicolas Orsay, FR 7 8
Kaplan, Daniel Paris, FR 33 253
Oksenhendler, Thomas Gometz le Chatel, FR 6 46

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