Test apparatus, demodulation apparatus, test method, demodulation method and electric device

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 8159290
APP PUB NO 20100327967A1
SERIAL NO

12820054

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Abstract

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Provided is a test apparatus for testing a device under test that outputs, as an output signal, an amplitude-phase modulated signal having a level and a transition point phase selected from among a plurality of levels and a plurality of phases according to transmission data, the test apparatus comprising a comparing section that compares the output signal to a first comparison level, which is less than the expected level, before the expected phase, and compares the output signal to a second comparison level, which is greater than the expected level, and to a third comparison level, which is less than the expected level, after the expected phase; and a judging section that judges that the output signal matches the expected values on a condition that (i) the output signal is less than or equal to the first comparison level before the expected phase and (ii) the output signal is less than or equal to the second comparison level and greater than or equal to the third comparison level after the expected phase.

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Patent Owner(s)

Patent OwnerAddress
ADVANTEST CORPORATIONTOKYO

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Okayasu, Toshiyuki Saitama, JP 128 1149
Yamamoto, Kazuhiro Saitama, JP 235 2532

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