System and method for the automated analysis of samples
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United States of America Patent
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Apr 17, 2012
Grant Date -
Nov 11, 2010
app pub date -
May 3, 2010
filing date -
May 6, 2009
priority date (Note) -
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Abstract
The present invention pertains to a system for the automated analysis of samples, comprising: a first optical device including at least one receptacle for receiving at least one of said samples and a receptacle-associated optical unit including at least one receptacle-associated light source for emitting light adapted for determining a color of said sample and generating a light beam for irradiating said sample contained in said receptacle and at least one receptacle-associated light detector for detecting light transmitted through said sample and generating a receptacle-associated detection signal; a second optical device including at least one test element provided with at least one test zone for applying said sample, said test zone being subject to an optically detectable change in response to at least one characteristic of said sample being different from said color and a test element-associated optical unit.
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