US Patent No: 8,161,438

Number of patents in Portfolio can not be more than 2000

Determining mutual inductance between intentional inductors

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Abstract

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Various methods for analyzing mutual inductance in an integrated circuit layout are disclosed. In one exemplary embodiment, for example, circuit design information indicative of a first inductor and a second inductor is received. A dipole moment associated with the first inductor is determined, where the magnetic field associated with the dipole moment is representative of magnetic fields created by respective turns in the first inductor. A mutual inductance between the first inductor and the second inductor is determined by determining a magnetic flux of the magnetic field of the dipole moment through surfaces bounded by respective wire segments of the second inductor.

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First Claim

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Patent Owner(s)

Patent OwnerAddressTotal Patents
MENTOR GRAPHICS CORPORATIONWILSONVILLE, OR946

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Escovar, Rafael Grenoble, FR 11 205
Ortiz, Salvador Grenoble, FR 10 154
Suaya, Roberto Meylan, FR 22 288

Cited Art Landscape

Patent Info (Count) # Cites Year
 
Other [Check patent profile for assignment information] (2)
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2004/0158,801 Method of manufacturing an inductor 10 2004
 
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APACHE DESIGN, INC. (2)
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NEC CORPORATION (2)
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MENTOR GRAPHICS CORPORATION (13)
6,934,669 Capacitance measurements for an integrated circuit 22 1999
7,099,808 Capacitance and transmission line measurements for an integrated circuit 10 2001
7,013,442 Synthesis strategies based on the appropriate use of inductance effects 18 2002
7,496,871 Mutual inductance extraction using dipole approximations 11 2004
2005/0120,316 Mutual inductance extraction using dipole approximations 33 2004
7,260,796 Capacitance measurements for an integrated circuit 10 2005
* 7,426,706 Synthesis strategies based on the appropriate use of inductance effects 13 2006
7,454,300 Extracting high frequency impedance in a circuit design using broadband representations 13 2007
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2008/0276,207 Modeling the skin effect using efficient conduction mode techniques 9 2008
2009/0013,300 SYNTHESIS STRATEGIES BASED ON THE APPROPRIATE USE OF INDUCTANCE EFFECTS 11 2008
* 2009/0172,613 Mutual Inductance extraction using dipole approximations 10 2009
* 2009/0228,847 HIGH-FREQUENCY VLSI INTERCONNECT AND INTENTIONAL INDUCTOR IMPEDANCE EXTRACTION IN THE PRESENCE OF A MULTI-LAYER CONDUCTIVE SUBSTRATE 12 2009
 
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THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK (1)
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ARM FINANCE OVERSEAS LIMITED (1)
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CARNEGIE MELLON UNIVERSITY (2)
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* Cited By Examiner

Patent Citation Ranking

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Patent Info (Count) # Cites Year
 
Other [Check patent profile for assignment information] (1)
* 2013/0080,985 ELECTROSTATIC DAMAGE PROTECTION CIRCUITRY VERIFICATION 0 2012
 
MENTOR GRAPHICS CORPORATION (8)
8,549,449 Mutual inductance extraction using dipole approximations 4 2009
* 2009/0172,613 Mutual Inductance extraction using dipole approximations 10 2009
* 8,650,522 Determining mutual inductance between intentional inductors 0 2012
* 2012/0204,139 DETERMINING MUTUAL INDUCTANCE BETWEEN INTENTIONAL INDUCTORS 3 2012
8,732,648 High-frequency VLSI interconnect and intentional inductor impedance extraction in the presence of a multi-layer conductive substrate 2 2012
8,826,204 Mutual inductance extraction using dipole approximations 0 2013
8,910,108 High-frequency VLSI interconnect and intentional inductor impedance extraction in the presence of a multi-layer conductive substrate 0 2014
9,230,054 High-frequency VLSI interconnect and intentional inductor impedance extraction in the presence of a multi-layer conductive substrate 0 2014
* Cited By Examiner

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