Multi-step deposition control

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United States of America Patent

PATENT NO 8163571
APP PUB NO 20080299681A1
SERIAL NO

12021791

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Abstract

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For providing control of two-step or a multi-step deposition process, a method and a corresponding deposition system is provided comprising providing a deposition process having at least two sub-processes employing different sets of process parameters, wherein each set of process parameters comprises at least one process parameter. The method comprises controllably generating an actual value for at least one first process parameter by taking into account at least one previous value of the respective first process parameter, wherein each first process parameter is a process parameter of said at least two sets of process parameters.

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Patent Owner(s)

Patent OwnerAddress
ADVANCED MICRO DEVICES INC2485 AUGUSTINE DRIVE SANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jaeger, Roland Goerlitz, DE 4 15
Koschinsky, Frank Radebeul, DE 22 650
Wagenbreth, Frank Dresden, DE 2 7

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