Method and apparatus for sensing, measurement or characterization of display elements integrated with the display drive scheme, and system and applications using the same
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United States of America Patent
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May 1, 2012
Grant Date -
Feb 18, 2010
app pub date -
Feb 11, 2009
filing date -
Feb 11, 2008
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Methods and systems for electrical sensing, measurement and characterization of display elements are described. An embodiment includes integrating the electrical sensing, measurement and characterization with the display drive scheme. This embodiment allows for measurement of DC or operational hysteresis voltages and/or response times of interferometric modulator MEMS devices, for example, to be fully integrated with the display driver IC and/or the display drive scheme. Another embodiment allows these measurements to be performed and used without resulting in display artifacts visible to a human user. Another embodiment allows the measurement circuitry to be integrated with the display driver IC and/or the display drive scheme re-using several existing circuitry components and features, thus allowing for integration of the measurement method and its use relatively easily.
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