Mechanism and system for programmable measurement of aggregate metrics from a dynamic set of nodes

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United States of America Patent

PATENT NO 8174990
APP PUB NO 20080198757A1
SERIAL NO

11676074

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Abstract

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A method for measuring performance of system. The method includes the steps of retrieving a metric definition from a declarative metrics specification, obtaining a list of computing nodes from a database that are currently assigned to the metric definition, obtaining resource data provided by the computing nodes in the list of computing nodes and determining the metric of system performance based on the metric definition and the resource data. The computing nodes in the list of computing nodes are nodes of a cluster of nodes having a dynamically varying node count.

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Patent Owner(s)

Patent OwnerAddress
SERVICENOW INC2225 LAWSON LANE SANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dan, Asit Pleasantville, US 56 2530
King, Richard P Scarsdale, US 24 652
Ludwig, Heiko New York, US 16 143
Schmidt, Andrea Boeblingen, DE 23 241
Wagner, Hendrik Stuttgart, DE 38 729

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