Single event transient mitigation and measurement in integrated circuits

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United States of America Patent

PATENT NO 8191021
SERIAL NO

12361955

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Abstract

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A method for single event transient filtering in an integrated circuit device is described. The device comprises three sequential elements, each having a data input and a data output with each of the three data outputs coupled to one of three inputs of a voting gate. The method comprises generating first and second nominally equivalent logic signals in first and second SET domains, converting the first and second nominally equivalent logic signals into first, second and third nominally equivalent data channels, and transmitting the first, second and third nominally equivalent data channels to the data inputs of the first, second and third sequential elements. Provision is made for applying the method to logic designs implemented in programmable logic integrated circuit devices.

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Patent Owner(s)

Patent OwnerAddress
MICROSEMI SOC CORP2355 WEST CHANDLER BLVD CHANDLER AS 85224-6199

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Rezgui, Sana San Francisco, US 13 434

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