Dual tone development processes

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United States of America Patent

PATENT NO 8197996
APP PUB NO 20100119960A1
SERIAL NO

12560873

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Abstract

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A method and system for patterning a substrate using a dual-tone development process is described. The method and system comprise using a resist material having a polymer backbone with a plurality of protecting groups attached thereto to improve process latitude and critical dimension uniformity for the dual-tone development process.

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITED3-1 AKASAKA 5-CHOME MINATO-KU TOKYO 107-6325

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fonseca, Carlos A Fishkill, US 36 359
Scheer, Steven Austin, US 26 280
Somervell, Mark Austin, US 25 174

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