Method of manufacturing an SPM probe with a scanning tip and with an alignment aid located opposite the scanning tip
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United States of America Patent
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Jun 26, 2012
Grant Date -
Apr 15, 2010
app pub date -
Oct 9, 2009
filing date -
Oct 11, 2008
priority date (Note) -
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status (Latency Note)
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Abstract
A method of manufacturing an SPM probe having a support element, a cantilever, and a scanning tip on an underside of the cantilever, and having a mark located on the top side of the cantilever opposite the scanning tip. The mark on the top side of the cantilever is located exactly opposite the scanning tip on the underside of the cantilever. This makes it possible to identify the exact position of the scanning tip in the scanning probe microscope from the upward-pointing top side of the cantilever, which significantly simplifies the alignment of the SPM probe. The support element with the cantilever may be prefabricated conventionally and the scanning tip and the mark are then produced on the cantilever in a self-aligning way by means of a particle-beam-induced material deposition based on a gas-induced process.
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