In-line process measurement systems and methods
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United States of America Patent
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Jul 3, 2012
Grant Date -
Mar 25, 2010
app pub date -
Mar 27, 2008
filing date -
Mar 30, 2007
priority date (Note) -
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Abstract
A method of using multivariate optical computing in real-time to collect instantaneous data about a process stream includes installing an optical analysis system proximate a process line, the process line being configured to move a material past a window of the optical analysis system; illuminating a portion of the material with a light from the optical analysis system; directing the light carrying information about the portion through at least one multivariate optical element in the optical analysis system to produce an instantaneous measurement result about the portion; and continuously averaging the instantaneous measurement result over a period of time to determine an overall measurement signal of the material.
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