Device for measuring superfine particle masses
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United States of America Patent
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Jul 24, 2012
Grant Date -
Apr 8, 2010
app pub date -
Feb 27, 2008
filing date -
Mar 23, 2007
priority date (Note) -
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status (Latency Note)
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Abstract
A device for measuring superfine particle masses including a quartz oscillator and an exposure system having at least two measuring chambers. Each of the at least two measuring chambers has a same geometry, a deposition surface for particles, and an aerosol feed directed at the respective disposition surface configured to feed an aerosol onto the respective deposition surface. At least one of the respective deposition surfaces is disposed on the quartz oscillator.
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