Methods and apparatus for assay measurements
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United States of America Patent
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Jul 24, 2012
Grant Date -
May 24, 2007
app pub date -
May 2, 2006
filing date -
Nov 23, 2005
priority date (Note) -
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Abstract
Methods and apparatuses for performing assays involving binding material elements with a plurality of bonds over a substantial area of a surface of a resonant device establishing a normalized exposure. The methods and apparatuses also involve controlling an external influence applied to the material elements over a first period of time and measuring a signal during a second period of time that is indicative of the change in the amount of material elements bound to the surface relative to the normalized exposure. In some cases, the measured signals are integrated with respect to time to determine the time averaged amount of material elements bound to the surface.
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