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Abstract

An apparatus for detecting tampering with an integrated circuit (IC), the apparatus comprising a second circuit comprising at least one conductor for conducting electrical current, the electrical current comprising, during at least one period of time, current of known strength, the electrical current generating a magnetic field, at least one magnetic field sensing device operatively associated with the IC, the sensing device having at least one electrical characteristic responsive to changes in a sensed magnetic field, the magnetic field sensing device being positioned so as to sense the magnetic field generated by current in the at least one conductor, and an analyzer operatively associated with the at least one magnetic field sensing device and the IC, the analyzer determining that the IC is being tampered with based, at least in part, on changes in the at least one electrical characteristic of the at least one magnetic field sensing device in response to changes in the sensed magnetic field generated by the electrical current in the at least one conductor during the at least one period of time. Related apparatus and methods are also described.

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First Claim